Field Emission from As-Grown and Ion-Beam-Sharpened Diamond Particles Deposited on Silicon Tips
نویسندگان
چکیده
Ion-beam bombardment/rnilling was used for sharpening of diamond particles deposited on ends of silicon tips. Radii curvature of diamond coating down to about 20 nm have been formed in such a way. Field emission experiments with sharpened diamond coated emitters have shown that the ion beam treatment effects a considerable shift of current-voltage characteristics of in the lower voltage region.
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تاریخ انتشار 2016